Introduction of basic methods for semiconductor material and device characterization. Topics include resistivity, carrier doping concentration, contact resistance, Schottky barrier height, series resistance, channel length, threshold voltage, mobility, oxide and interface trapped charge, deep level impurities, carrier lifetime, and optical, chemical and physical characterization
Semiconductor Characterization
Host University
Old Dominion University
Semester
Fall 2022
Course Number
ECE 874 CRN 22493
Credits
3
Discipline
Electrical & Computer Engineering
Instructor
Baumgart, Helmut (HBAUMGAR@ODU.EDU)
Course Information
Prerequisites
ECE 473 or ECE 573 or equivalent.