Introduction of basic methods for semiconductor material and device characterization. Topics include resistivity, carrier doping concentration, contact resistance, Schottky barrier height, series resistance, channel length, threshold voltage, mobility, oxide and interface trapped charge, deep level impurities, carrier lifetime, and optical, chemical and physical characterization
Old Dominion University
ECE 774 CRN 774
Electrical & Computer Engineering
Baumgart, Helmut (HBAUMGAR@ODU.EDU)
CE 473 or ECE 573 or equivalent.